{"id":284,"date":"2024-11-08T11:51:06","date_gmt":"2024-11-08T02:51:06","guid":{"rendered":"http:\/\/202409172208436859978.onamaeweb.jp\/wp\/?page_id=284"},"modified":"2024-12-17T11:41:36","modified_gmt":"2024-12-17T02:41:36","slug":"noise-probe","status":"publish","type":"page","link":"https:\/\/www.devicelab.co.jp\/?page_id=284","title":{"rendered":"Noise Probe"},"content":{"rendered":"\n<figure class=\"wp-block-image size-large\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"239\" src=\"http:\/\/202409172208436859978.onamaeweb.jp\/wp\/wp-content\/uploads\/2024\/11\/cropped-DSC2135-1024x239.jpg\" alt=\"\" class=\"wp-image-268\" srcset=\"https:\/\/www.devicelab.co.jp\/wp-content\/uploads\/2024\/11\/cropped-DSC2135-1024x239.jpg 1024w, https:\/\/www.devicelab.co.jp\/wp-content\/uploads\/2024\/11\/cropped-DSC2135-300x70.jpg 300w, https:\/\/www.devicelab.co.jp\/wp-content\/uploads\/2024\/11\/cropped-DSC2135-768x179.jpg 768w, https:\/\/www.devicelab.co.jp\/wp-content\/uploads\/2024\/11\/cropped-DSC2135.jpg 1200w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/figure>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Noise Probe<\/strong><\/h2>\n\n\n\n<p style=\"font-size:clamp(15.747px, 0.984rem + ((1vw - 3.2px) * 0.86), 24px);\"><strong>Demonstration of Entrope\u00ae\ufe0e Noise Probe available at TechRxiv Preprint Server<\/strong><\/p>\n\n\n\n<div data-wp-interactive=\"core\/file\" class=\"wp-block-file\"><object data-wp-bind--hidden=\"!state.hasPdfPreview\" hidden class=\"wp-block-file__embed\" data=\"https:\/\/www.devicelab.co.jp\/wp-content\/uploads\/2024\/12\/FINAL-VERSION.pdf\" type=\"application\/pdf\" style=\"width:100%;height:440px\" aria-label=\"FINAL VERSION\u306e\u57cb\u3081\u8fbc\u307f\u3002\"><\/object><a id=\"wp-block-file--media-7cf22836-a559-41cd-bdc3-206e47f4bada\" href=\"https:\/\/www.devicelab.co.jp\/wp-content\/uploads\/2024\/12\/FINAL-VERSION.pdf\">FINAL VERSION<\/a><a href=\"https:\/\/www.devicelab.co.jp\/wp-content\/uploads\/2024\/12\/FINAL-VERSION.pdf\" class=\"wp-block-file__button wp-element-button\" download aria-describedby=\"wp-block-file--media-7cf22836-a559-41cd-bdc3-206e47f4bada\">\u30c0\u30a6\u30f3\u30ed\u30fc\u30c9<\/a><\/div>\n\n\n\n<p>Also, there is some literature about the High-Frequency Noise Probe in the early development stage. For details, please see below.<\/p>\n\n\n\n<ol class=\"wp-block-list\">\n<li>Kenji Ohmori, Ryu Hasunuma, Satoshi Yamamoto, Yoshinori Tamura, Hao Jiang, Noboru Ishihara, Kazuya Masu, and Keisaku Yamada<br> <a href=\"http:\/\/ieeexplore.ieee.org\/document\/6576621\/\"><mark style=\"background-color:rgba(0, 0, 0, 0);color:#00ccff\" class=\"has-inline-color\">&#8220;Application of Low-Noise TIA ICs for Novel Sensing of MOSFET Noise up to the GHz Region&#8221;<\/mark><\/a><br><strong>VLSI Symposium on Circuits<\/strong>, June 11-14, 2013, Kyoto, Japan.<br>\u3000\u3000\u3000\u3000\u3000\u3000<\/li>\n\n\n\n<li>K. Ohmori, Ryu Hasunuma, Wei Feng, and Keisaku Yamada<br><a href=\"https:\/\/doi.org\/10.1109\/VLSIT.2012.6242502\"><mark style=\"background-color:rgba(0, 0, 0, 0);color:#00ccff\" class=\"has-inline-color\">\u201cContinuous characterization of MOSFET from low-frequency noise to thermal noise using a novel measurement system up to 100 MHz\u201d<\/mark><\/a><br><strong>VLSI Symposium on Technology<\/strong>, June 12-14, 2012, Hawaii, USA.<br>\u3000\u3000\u3000\u3000<\/li>\n\n\n\n<li>\u5927\u6bdb\u5229\u5065\u6cbb\u3001\u5c71\u7530\u5553\u4f5c<br><a href=\"http:\/\/iss.ndl.go.jp\/books\/R000000004-I025011736-00\"><mark style=\"background-color:rgba(0, 0, 0, 0);color:#00ccff\" class=\"has-inline-color\">\u300cMOSFET\u306e\u96d1\u97f3\u7279\u6027\u3092\u8a08\u6e2c\u3059\u308b\u65b0\u624b\u6cd5\u3092\u958b\u767a\u300d<\/mark><\/a><br>\u65e5\u7d4c\u30a8\u30ec\u30af\u30c8\u30ed\u30cb\u30af\u30b9 2013\u5e7411\u670825\u65e5\u53f7 pp. 87-93.<br>\u3000\u3000<\/li>\n<\/ol>\n","protected":false},"excerpt":{"rendered":"<p>Noise Probe Demonstration of Entrope\u00ae\ufe0e Noise Probe available at TechRxiv Preprint Server Also, there is some l [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":268,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"page-no-title","meta":{"footnotes":""},"class_list":["post-284","page","type-page","status-publish","has-post-thumbnail","hentry"],"_links":{"self":[{"href":"https:\/\/www.devicelab.co.jp\/index.php?rest_route=\/wp\/v2\/pages\/284","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.devicelab.co.jp\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.devicelab.co.jp\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.devicelab.co.jp\/index.php?rest_route=\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.devicelab.co.jp\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=284"}],"version-history":[{"count":16,"href":"https:\/\/www.devicelab.co.jp\/index.php?rest_route=\/wp\/v2\/pages\/284\/revisions"}],"predecessor-version":[{"id":466,"href":"https:\/\/www.devicelab.co.jp\/index.php?rest_route=\/wp\/v2\/pages\/284\/revisions\/466"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.devicelab.co.jp\/index.php?rest_route=\/wp\/v2\/media\/268"}],"wp:attachment":[{"href":"https:\/\/www.devicelab.co.jp\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=284"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}