{"id":289,"date":"2024-11-08T11:54:32","date_gmt":"2024-11-08T02:54:32","guid":{"rendered":"http:\/\/202409172208436859978.onamaeweb.jp\/wp\/?page_id=289"},"modified":"2024-12-04T11:53:21","modified_gmt":"2024-12-04T02:53:21","slug":"publications","status":"publish","type":"page","link":"https:\/\/www.devicelab.co.jp\/?page_id=289","title":{"rendered":"Publications"},"content":{"rendered":"\n
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Publications<\/strong><\/h2>\n\n\n\n

Here is a list of selected conference proceedings, journal papers, and materials\u00a0related to our products and services. Most of them have been published before launching Device Lab Inc.
Selected publications (Dr. K. Ohmori)<\/mark><\/a><\/p>\n\n\n\n

Conference proceedings<\/strong><\/h2>\n\n\n\n
    \n
  1. K. Ohmori, A. Shinoda, K. Kawai, Z. Wei, T. Mikawa, and R. Hasunuma
    \u201cReduction of Cycle-to-Cycle Variability in ReRAM by Artificially-Induced Filamentary Refresh\u201d
    Non-Volatile Memory Technology Symposium (NVMTS)<\/mark><\/a> , Aug. 30 \u2013 Sep. 1, 2017, RWTH Aachen University, Germany.<\/li>\n\n\n\n
  2. K. Ohmori, A. Shinoda, K. Kawai, Z. Wei, T. Mikawa, and R. Hasunuma
    \u201cReduction of Cycle-to-Cycle Variability in ReRAM by Filamentary Refresh\u201d<\/mark><\/a>
    VLSI Symposium on Technology<\/strong>, June 5-8, 2017, Kyoto, Japan.<\/li>\n\n\n\n
  3. A. Suzuki, T. Kamioka, Y. Kamakura, K. Ohmori, K. Yamada, and T. Watanabe
    \u201cSource-induced RDF Overwhelms RTN in Nanowire Transistor: Statistical Analysis with Full Device EMC\/MD Simulation\u201d<\/mark><\/a><\/li>\n\n\n\n
  4. Kenji Ohmori, Ryu Hasunuma, Satoshi Yamamoto, Yoshinori Tamura, Hao Jiang, Noboru Ishihara, Kazuya Masu, and Keisaku Yamada
    \u201cApplication of Low-Noise TIA ICs for Novel Sensing of MOSFET Noise up to the GHz Region\u201d<\/mark><\/a>
    VLSI Symposium on Circuits<\/strong>, June 11-14, 2013, Kyoto, Japan.<\/li>\n\n\n\n
  5. Kenji Ohmori, Ryu Hasunuma, Wei Feng, and Keisaku Yamada
    \u201cContinuous characterization of MOSFET from low-frequency noise to thermal noise using a novel measurement system up to 100 MHz\u201d<\/mark>
    <\/a>VLSI Symposium on Technology<\/strong>, June 12-14, 2012, Hawaii, USA.<\/li>\n\n\n\n
  6. Kenji Ohmori, Ryu Hasunuma, and Keisaku Yamada
    \u201cDevelopment of a Novel System for Characterizing MOSFET Noise in Higher Frequency Regimes\u201d<\/mark><\/a>
    International Conference on Microelectronic Test Structures (ICMTS)<\/strong>, March 19-22, 2012, San Diego, California, USA.<\/li>\n\n\n\n
  7. W. Feng, R. Hettiarachchi, Y. Lee, S. Sato, K. Kakushima, M. Sato, K. Fukuda, M. Niwa, K. Yamabe, K. Shiraishi, H. Iwai, and K. Ohmori
    \u201cFundamental origin of excellent low-noise property in 3D Si-MOSFETs ~ Impact of charge-centroid in the channel due to quantum effect on 1\/f noise ~\u201d<\/mark><\/a>
    International Electron Devices Meeting (IEDM)<\/strong>, Washington DC, USA, Dec. 5-7, 2011.<\/li>\n\n\n\n
  8. K. Ohmori, W. Feng, S. Sato, R. Hettiarachchi, M. Sato, T. Matsuki, K. Kakushima, H. Iwai, and K. Yamada
    \u201cDirect Real-Time Observation of Channel Potential Fluctuation Correlated to Random Telegraph Noise of Drain Current Using Nanowire MOSFETs with Four-Probe Terminals\u201d<\/mark><\/a>
    VLSI Symposium on Technology<\/strong>, Kyoto, Japan, June 14-16, 2011.<\/li>\n\n\n\n
  9. K. Ohmori, T. Matsuki, D. Ishikawa, T. Morooka, T. Aminaka, Y. Sugita, T. Chikyow, K. Shiraishi, Y. Nara, K. Yamada
    \u201cImpact of Additional Factors in Threshold Voltage Variability of Metal\/High-k Gate Stacks and Its Reduction by Controlling Crystalline Structures and Grains in the Metal Gates\u201d<\/mark><\/a>
    International Electron Devices Meeting (IEDM)<\/strong>, San Francisco, USA, Dec. 15-17, 2008.<\/li>\n\n\n\n
  10. K. Ohmori, T. Chikyow, T. Hosoi, H. Watanabe, K. Nakajima, T. Adachi, A. Ishikawa, Y. Sugita, Y. Nara, Y. Ohji, K. Shiraishi, K. Yamabe, K. Yamada
    \u201cWide Controllability of Flatband Voltage by Tuning Crystalline Microstructures in Metal Gate Electrodes\u201d<\/mark><\/a>
    International Electron Devices Meeting (IEDM)<\/strong>, Washington DC, USA, Dec. 10-12, 2007.
    <\/li>\n<\/ol>\n\n\n\n

    Journal papers<\/strong><\/h2>\n\n\n\n
      \n
    1. W. Feng, H. Shima, K. Ohmori, H. Akinaga
      \u201cInvestigation of switching mechanism in HfOx-ReRAM under low power and conventional operation modes\u201d<\/mark><\/a>
      Scientific Reports 6<\/strong> (2016) Article number: 39510.<\/li>\n\n\n\n
    2. W. Feng, C. M. Dou, M. Niwa, K. Yamada, K. Ohmori
      \u201cImpact of Random Telegraph Noise Profiles on Drain-Current Fluctuation during Dynamic Gate Bias\u201d<\/mark><\/a>
      IEEE Electron Device Letters 35<\/strong> (2014) pp. 3-5.
      <\/li>\n<\/ol>\n\n\n\n

      Press releases<\/strong><\/h2>\n\n\n\n
        \n
      1. \u62b5\u6297\u5909\u5316\u578b\u30e1\u30e2\u30ea\u306e\u66f8\u304d\u63db\u3048\u3070\u3089\u3064\u304d\u6291\u5236\u3092\u5b9f\u73fe<\/mark><\/a>
        <\/a>\uff082017\u5e746\u6708\u3001\u7b51\u6ce2\u5927\u5b66\uff09        PDF<\/mark><\/a><\/li>\n\n\n\n
      2. \u62b5\u6297\u5909\u5316\u30e1\u30e2\u30ea\u30fc\u306e\u6319\u52d5\u3092\u96fb\u6d41\u30ce\u30a4\u30ba\u304b\u3089\u89e3\u660e\u3000- \u4e0d\u63ee\u767a\u6027\u30e1\u30e2\u30ea\u30fc\u306e\u7528\u9014\u62e1\u5927\u3078\u5411\u3051\u3066 \u2013<\/mark>
        <\/a>\uff082017\u5e741\u6708\u3001\u7523\u696d\u6280\u8853\u7dcf\u5408\u7814\u7a76\u6240\u30fb\u7b51\u6ce2\u5927\u5b66\uff09        PDF<\/mark><\/a><\/li>\n\n\n\n
      3. \u72ec\u81ea\u6280\u8853\u306e\u96d1\u97f3\u30d7\u30ed\u30fc\u30d6\u306b\u958b\u767a\u3057\u305fIC\u3092\u642d\u8f09\u3057\u3001\u96fb\u5b50\u30c7\u30d0\u30a4\u30b9\u306e\u96d1\u97f3\u7279\u6027\u3092\u5e83\u5e2f\u57df\u3067\u8a08\u6e2c\u53ef\u80fd\u306b<\/mark>
        <\/a>\uff082013\u5e746\u6708\u3001\u7b51\u6ce2\u5927\u5b66\uff09        PDF<\/mark><\/a><\/li>\n\n\n\n
      4. \u7acb\u4f53\u69cb\u9020\u30c8\u30e9\u30f3\u30b8\u30b9\u30bf\u306e\u30c9\u30ec\u30a4\u30f3\u96fb\u6d41\u96d1\u97f3\u306e\u4f4e\u6e1b\u6a5f\u69cb\u3092\u660e\u3089\u304b\u306b\u3057\u3001\u9759\u304b\u306a\u30c8\u30e9\u30f3\u30b8\u30b9\u30bf\u69cb\u9020\u5b9f\u73fe\u306e\u8a2d\u8a08\u6307\u91dd\u3092\u958b\u767a\u3000\u30fc \u91cf\u5b50\u9589\u3058\u8fbc\u3081\u306b\u3088\u308b\u30c1\u30e3\u30cd\u30eb\u306e\u96fb\u5316\u4e2d\u5fc3\u5236\u5fa1\u306b\u9375 \u30fc
        \uff082011\u5e7412\u6708\u3001\u7b51\u6ce2\u5927\u5b66\uff09        PDF<\/mark><\/a>
        <\/li>\n<\/ol>\n\n\n\n

        Others<\/strong><\/h2>\n\n\n\n
          \n
        1. \u5927\u6bdb\u5229\u5065\u6cbb\u3001\u5c71\u7530\u5553\u4f5c
          \u300cMOSFET\u306e\u96d1\u97f3\u7279\u6027\u3092\u8a08\u6e2c\u3059\u308b\u65b0\u624b\u6cd5\u3092\u958b\u767a\u300d<\/mark><\/a>
          \u65e5\u7d4c\u30a8\u30ec\u30af\u30c8\u30ed\u30cb\u30af\u30b9 2013\u5e7411\u670825\u65e5\u53f7 pp. 87-93.<\/li>\n<\/ol>\n\n\n\n

          <\/p>\n","protected":false},"excerpt":{"rendered":"

          Publications Here is a list of selected conference proceedings, journal papers, and materials\u00a0related to our p […]<\/p>\n","protected":false},"author":1,"featured_media":268,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"page-no-title","meta":{"footnotes":""},"class_list":["post-289","page","type-page","status-publish","has-post-thumbnail","hentry"],"_links":{"self":[{"href":"https:\/\/www.devicelab.co.jp\/index.php?rest_route=\/wp\/v2\/pages\/289","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.devicelab.co.jp\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.devicelab.co.jp\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.devicelab.co.jp\/index.php?rest_route=\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.devicelab.co.jp\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=289"}],"version-history":[{"count":13,"href":"https:\/\/www.devicelab.co.jp\/index.php?rest_route=\/wp\/v2\/pages\/289\/revisions"}],"predecessor-version":[{"id":445,"href":"https:\/\/www.devicelab.co.jp\/index.php?rest_route=\/wp\/v2\/pages\/289\/revisions\/445"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.devicelab.co.jp\/index.php?rest_route=\/wp\/v2\/media\/268"}],"wp:attachment":[{"href":"https:\/\/www.devicelab.co.jp\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=289"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}